About this Journal  |  Author Guidelines  |   Submit a Manuscript     

International Journal of Image and Signal Systems Engineering

Volume 1, No. 1, 2017, pp 37-44
http://dx.doi.org/10.21742/ijisse.2017.1.1.06

Abstract



Research on Using the Gaussian Curvature of the Peaks Measuring a Laser Microprocessing Surface



    Yunfei Duan1 , Libin Guo1 , Zhihang Zhang2 , Fenglong Yao1 , Longwen Li3
    1College of Mechanical and Electrical Engineering, Harbin Engineering University, Harbin, Heilongjiang, China
    2School of Mechanical Engineering, Luoyang Institute of Science and Technology, Luoyang, Henan, China
    3School of Mechanical and Power Engineering, Harbin University of Science and Technology, Harbin, Heilongjiang, China

    Abstract

    The measurement of the microprocessing surface is attracting more and more attention. By analyzing typical precision machining technology, it studies the Gaussian curvatures of the peaks to measure a laser microprocessing surface. Laser microprocessing surface as one typical microprocessing technology, it shows the the surface consists of one hyperboloid of two sheets with many connected peaks on the saddle surface and a negative Gaussian curvature. In addition, the number of convex peaks increases, which leads to the Gaussian curvature decreasing. Finally, it shows that the characterization accuracy is high using the Gaussian curvature, which can characterize the texture and flatness and the topography of the surface’s convex peaks. It completely satisfies the requirements for high precision of the measurement of microprocessing surface quality.


 

Contact Us

  • PO Box 5074, Sandy Bay Tasmania 7005, Australia
  • Phone: +61 3 9028 5994